• Graphical representation of reflection from single and double coating systems on metallic substrate

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      https://www.ias.ac.in/article/fulltext/pram/018/02/0215-0223

    • Keywords

       

      Reflection coefficient; thin film optics; optical constants; tellurium silicon monoxide films; double coating

    • Abstract

       

      In the present work a new graphical method is described to represent the resultant of the multiply reflected waves from coating systems consisting of single and double layers on metallic substrate, taking into account the optical phase properties of the films.

    • Author Affiliations

       

      N Barakat1 2 S Mokhtar1 W Osman1 3

      1. National Institute of Standards, Cairo, Egypt
      2. Faculty of Science, Ain Shams University, Cairo, Egypt
      3. Faculty of Science, Cairo University, Cairo, Egypt
    • Dates

       
  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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