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      https://www.ias.ac.in/article/fulltext/pram/016/04/0281-0286

    • Keywords

       

      X-ray diffraction; thermal expansion; copper indium disulphide

    • Abstract

       

      The lattice parameters of the compound copper indium disulphide (CuInS2) have been measured by x-ray diffraction. The data have been used to evaluate the coefficients of thermal expansion, perpendicular and parallel to the principal axis. The thermal expansion studies revealed the anisotropy between the axial expansion coefficients having a larger coefficient of expansion alonga axis than that alongc axis. The anisotropic thermal expansion of this compound is interpreted in terms of the thermal expansion of the Cu-S and In-S bonds.

    • Author Affiliations

       

      P Kistaiah1 Y C Venudhar1 K Sathyanarayana Murthy1 Leela Iyengar1 K V Krishna Rao1 2

      1. Department of Physics, University College of Science, Osmania University, Hyderabad - 500 007, India
      2. Department de Physique, Institute de Exactes Sciences, Universite de Constantine, Constantine, Algeria
    • Dates

       
  • Pramana – Journal of Physics | News

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