• Diffusion of Ag through Se and its effect on interferometric thickness measurement

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      https://www.ias.ac.in/article/fulltext/pram/014/06/0501-0507

    • Keywords

       

      Selenium films; diffusion of silver; interference fringes

    • Abstract

       

      The effect of diffusion of silver through Se thin films, on the visibility of two and multiple beam interference fringes has been studied. For thickness measurements, Al has been found to be a suitable overcoating metallic layer as it does not diffuse through Se. The thickness was measured by multiple beam fringes at reflection.

    • Author Affiliations

       

      S Mokhtar1 S Abdel-Aziz1

      1. National Institute of Standards, Cairo, Egypt
    • Dates

       
  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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