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    • Electrical conduction and size effect in bismuth films

      A Rahman P C Mahanta

      Solids Volume 11 Issue 2 August 1978 pp 145-147

    • Fulltext

       

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      Permanent link:
      https://www.ias.ac.in/article/fulltext/pram/011/02/0145-0147

    • Keywords

       

      Size effect; ellipsoidal surface; diffuse scattering

    • Abstract

       

      The size effect on electrical conduction is observed in bismuth films in the region of film thickness above 2000 Å. Applying Fuchs-Sondheimer theory and assuming specularity parameterp = 0·8, the value of bulk resistivity and mean free path are obtained as 6·692 × 104 ohm-cm and 6000 Å respectively.

    • Author Affiliations

       

      A Rahman1 2 P C Mahanta1

      1. Department of Physics, Gauhati University, Gauhati - 781 014
      2. Department of Physics, B. Barooah College, Gauhati - 781 007

    • Dates

       
      Published
      August 1978
      Manuscript received
      7 October 1977
      Manuscript revised
      18 February 1978

  • Pramana – Journal of Physics | News

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      Posted on July 25, 2019

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