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      https://www.ias.ac.in/article/fulltext/jgen/096/02/0291-0297

    • Keywords

       

      wheat; alien introgression; leaf rust; bulked segregant analysis; simple-sequence repeat markers.

    • Abstract

       

      A Triticum timopheevii-derived bread wheat line, Selection G12, was screened with 40 pathotypes of leaf rust pathogen, Puccinia triticina at seedling stage and with two most commonly prevalent pathotypes 77-5 and 104-2 at adult plant stage. Selection G12 showed resistance at both seedling and adult plant stages. Genetic analysis in F1, F2 and F2.3 families at the seedling stage revealed that leaf rust resistance in Selection G12 is conditioned by a single incompletely dominant gene. The leaf rust resistance gene was mapped to chromosome 3BL with SSR markers Xgwm114 and Xgwm547 flanking the gene at a distance of 28.3 cM and 6 cM, respectively. Based on the nature of resistance and chromosomal location, it is inferred that Selection G12 carries a new gene for leaf rust resistance, tentatively named as LrSelG12.

    • Author Affiliations

       

      AMIT KUMAR SINGH1 2 JAI BHAGWAN SHARMA1 VINOD 1 PRADEEP KUMAR SINGH1 ANUPAM SINGH1 NIHARIKA MALLICK1

      1. Indian Agricultural Research Institute (IARI), New Delhi 110 012, India
      2. Present address: Plant Breeding Institute, Cobbitty, Sydney, NSW 2570, Australia
    • Dates

       
  • Journal of Genetics | News

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