Theory is developed for the electrochemical impedance spectroscopy (EIS) of the diffusion limited adsorption process coupled with reversible charge transfer at rough electrodes under the influence of ubiquitous uncompensated solution resistance. This study quantitatively relates the impedance response ofrough electrode to its phenomenological components, viz., diffusion limited adsorption, reversible charge transfer and uncompensated solution resistance. The random roughness of electrode is expressed by thesurface statistical property, i.e., power spectrum of roughness. The fractal nature of roughness is characterizedin terms of fractal dimension, lower cut-off length and topothesy length. The high-frequency regime iscontrolled by the uncompensated solution resistance whereas the low-frequency regime is governed by theadsorption process. The magnitude of impedance as well as phase decreases with rise in adsorption isotherm(length) parameter. The intermediate frequency regime is controlled by the coupling of adsorption and uncompensated solution resistance with the diffusion process. The fractal roughness parameters has quantitative influence on the magnitude of impedance over whole frequency regime while the phase plot shows qualitative difference in the intermediate frequency regime. The governing length scales which controls the characteristic crossover frequencies are: diffusion length, adsorption-ohmic coupling length and topothesy length (or width of interface). The three emergent crossover frequencies are: (i) ohmic reduced innercrossover frequency (ii) adsorption roughness topothesy dependent pseudo-quasireversibility characteristic frequency (iii) outer crossover frequency.
Synopsis: This study quantitatively relates the impedance response of rough electrode to its phenomenological components, viz., diffusion limited adsorption, reversible charge transfer and uncompensated solution resistance. The random roughness of electrode is expressed by the surface statistical property, i.e., power spectrum of roughness.
Volume 135, 2023
Continuous Article Publishing mode
Click here for Editorial Note on CAP Mode