• Distinguishing crystallite size effects from those of structural disorder on the powder X-ray diffraction patterns of layered materials

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    • Keywords


      Layered double hydroxides; crystallite size; Scherrer broadening; stacking faults.

    • Abstract


      Both crystallite size effects and structural disorder contribute to the broadening of lines in the powder X-ray diffraction (PXRD) patterns of layered materials. Stacking faults, in particular, are ubiquitous in layered materials and aside from broadening also induce peaks due to select reflections to shift away from the Bragg positions. The effect of structural disorder has to be suitably discounted before the application of the Scherrer formula for the estimation of crystallite size.

    • Author Affiliations


      Sylvia Britto1 Sumy Joseph1 P Vishnu Kamath1

      1. Department of Chemistry, Central College, Bangalore University, Bangalore 560 001
    • Dates

  • Journal of Chemical Sciences | News

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