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    • Keywords


      Mössbauer spectroscopy; ion bombardment; ion implantation; material surfaces

    • Abstract


      Recent trends in the field of ion bombardment of material surfaces are reviewed with a brief discussion about the present understanding of the subject. The use of novel characterization concepts to explore the ion beam-induced phenomena is emphasized and in this context the importance of the technique of conversion electron Mössbauer spectroscopy (CEMS) is brought out. A number of specific examples of the use ofCEMS technique to studies on ion implantation, ion beam mixing and corrosion of ion-bombarded surfaces have been given.

    • Author Affiliations


      S B Ogale1 S V Ghaisas1 S M Kanetkar1 V G Bhide1

      1. Department of Physics, University of Poona, Pune - 411007, India
    • Dates

  • Journal of Chemical Sciences | News

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