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    • Fulltext

       

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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/045/0202

    • Keywords

       

      Fluorescence; UV–vis; SERS; pesticide residue.

    • Abstract

       

      To protect crops and improve yield, pesticides have been widely used in agricultural production. In this case, the detection of toxic residues in agricultural products is of great significance. To achieve that, spectroscopy is a commonly used analytical method, which combines the characteristics of low detection limit, wide linear range and high accuracy. At the same time, they provide simple, low-cost, fast and on-site results. The pesticide residue detection instruments based on spectral analysis have shown advantages and broad application prospects in the instrument market. In this paper, detection methods of pesticide residues based on fluorescence spectrometry, UV–vis (ultraviolet visible) spectrometry, as well as SERS (surface-enhanced Raman scattering) spectrometry are reviewed. This paper analyses and summarizes the research progress of different types of spectrometry in the detection of pesticide residues, and points outthat with the development of detection and monitoring technology, the corresponding rapid detection instrument for pesticide residues has become an indispensable tool in society.

    • Author Affiliations

       

      ZHIPENG WANG1 2 SHIJUAN LI1 PINGYUE HU2 RUI DAI2 BIN WU1 LING YANG1 YIJIA HUANG1 GUOQING ZHUANG1

      1. Sichuan Academy of Forestry Sciences, Chengdu 610081, People’s Republic of China
      2. State Key Laboratory of Oral Diseases, West China Hospital of Stomatology, Sichuan University, Chengdu 610041, People’s Republic of China

    • Dates

       
      Published
      18 October 2022
      Manuscript received
      28 January 2022
      Accepted
      2 June 2022
      Final version published online
      18 October 2022

  • Bulletin of Materials Science | News

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    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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