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    • Keywords


      TiO$_2$ thin films; Boron; XPS; MG degradation; simulated solar light.

    • Abstract


      Boron-modified TiO$_2$ thin films with different boron contents were obtained by the spin coating technique. Chemical composition and bonding were determined by X-ray photoelectron spectroscopy (XPS). Raman, UV–visible and photoluminescence spectroscopies were used to characterize the deposited films. XPS results revealed that the boron content varied from 2.1 to 9.0 at% and that Ti-O-B bonds are formed at the highest content. Raman spectra showed that incorporation of B in the titania lattice improved the crystallinity of the anatase phase and promoted a decrease in the crystallite size. Photoluminescence characterization indicated a quenching of the electron–hole recombination rate due to boron incorporation. The photocatalytic activity improved with films modified with B under solar-simulated irradiation.

    • Graphical Abstract


    • Author Affiliations



      1. Universidad Autónoma del Estado de México, Centro Conjunto de Investigación en Química Sustentable UAEMUNAM, C.P. 50200 Toluca, Mexico, Mexico
      2. Posgrado en Ciencia de Materiales, Universidad Autónoma del Estado de México, 50200 Toluca Estado de, Mexico, Mexico
      3. Departamento de Química, Instituto Nacional de Investigaciones Nucleares, Carr. México-Toluca S/N, C.P. 52750 La Marquesa Ocoyoacac, Mexico
      4. Instituto de Química, UNAM, CCIQS UAEM-UNAM, C.P. 04360 Mexico, Mexico
      5. Facultad de Química, Departamento de Ingeniería Química, UNAM, C.P. 04510 Mexico, Mexico
      6. Departamento de Física, Instituto Nacional de Investigaciones Nucleares, Carr. México-Toluca S/N, C.P. 52750 La Marquesa Ocoyoacac, Mexico
    • Dates

  • Bulletin of Materials Science | News

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