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    • Keywords


      SiNWs; SEM; Raman; total reflectance; transmittance; absorption.

    • Abstract


      In order to improve photovoltaic efficiency, researches have been carried out on silicon nanowires (SiNWs). In this article, we report a comparative study between silicon substrate (Si) and SiNWs developed by a metal-assisted chemical etching (Ag) method at different etching times (25, 10 and 5 min). Scanning electron microscopy (SEM), transmission electron microscopy and X-ray diffraction were used to collect the morphological and structural informationon the SiNWs. Raman spectroscopy shows that the intensity of the nanowires is 4 to 10 times higher than that of the substrate, and increases with increase in etching time. The total reflectance of SiNWs reduced to less than 5% over theentire visible range. The low reflectance and zero transmittance of SiNWs lead to higher absorbance in the visible wavelength range. The SiNW-etched nanowire structure (25 min) works best for capturing light, we believe that having longer nanowires improves the optical working of the nanostructures and may be a potential candidate for high efficiency photovoltaic solar cells and other optic devices.

    • Author Affiliations



      1. Laboratory of Microelectronics and Instrumentation (LR13ES12), Faculty of Science of Monastir, Avenue of Environment, University of Monastir, 5019 Monastir, Tunisia
      2. Higher Institute of Applied Sciences and Technology of Sousse, Taffala City (Ibn Khaldun), 4003 Sousse, Tunisia
      3. Faculty of Science of Bizerte, University of Carthage, 7021 Zarzouna, Tunisia
    • Dates

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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