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    • Keywords


      X-ray diffraction; a.c. conductivity; dielectric properties; complex electric modulus.

    • Abstract


      This work highlights some physical properties of Sb$_2$O$_3$ thin films obtained through heat treatment of Sb$_2$S$_3$ thin films under an atmospheric pressure at 400$^{\circ}$C. The obtained material is characterized by X-ray diffraction and impedance spectroscopy. X-ray diffraction analysis shows that Sb$_2$O$_3$ thin films were crystallized in cubic structure having a preferential growth along (222) plane. The grain size is found to be around 65 nm. The electrical conductivity was studied using impedance spectroscopy technique in the frequency range from 5 Hz to 13 MHz at temperatures lying in 638–698 K domain. Besides, the frequency and temperature dependence of the complex impedance, a.c. conductivity and complex electric modulus have been investigated.

    • Author Affiliations



      1. Unité de Physique des Dispositifs a Semi-Conducteurs, Faculté des Sciences de Tunis, Université de Tunis El Manar, 2092 Tunis, Tunisia
      2. Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, Ecole Nationale d’Ingénieurs de Tunis, Université de Tunis El Manar, 2092 Tunis, Tunisia
    • Dates

  • Bulletin of Materials Science | News

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      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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