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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/036/07/1323-1329

    • Keywords

       

      Transmission electron microscopy; Raman spectroscopy; boron; electrodeposition.

    • Abstract

       

      Structural characterization of electrodeposited boron was carried out by using transmission electron microscopy and Raman spectroscopy. Electron diffraction and phase contrast imaging were carried out by using transmission electron microscopy. Phase identification was done based on the analysis of electron diffraction patterns and the power spectrum calculated from the lattice images from thin regions of the sample. Raman spectroscopic examination was carried out to study the nature of bonding and the allotropic form of boron obtained after electrodeposition. The results obtained from transmission electron microscopy showed the presence of nanocrystallites embedded in an amorphous mass of boron. Raman microscopic studies showed that amorphous boron could be converted to its crystalline form at high temperatures.

    • Author Affiliations

       

      Ashish Jain1 C Ghosh2 T R Ravindran3 S Anthonysamy1 R Divakar2 E Mohandas2 G S Gupta4

      1. Chemistry Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
      2. Physical Metallurgy Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
      3. Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
      4. Department of Materials Engineering, Indian Institute of Science, Bangalore 560 012, India
    • Dates

       

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