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    • Keywords


      Nanostructured In2O3; thin films; spray pyrolysis; H2S gas sensor; low temperature.

    • Abstract


      Nanostructured indium oxide (In2O3) thin films were prepared by spray pyrolysis (SP) technique. X-ray diffraction (XRD) was used to investigate the structural properties and field emission scanning electron microscopy (FESEM) was used to confirm surface morphology of In2O3 films. Measurement of electrical conductivity and gas sensing performance were conducted using static gas sensing system. Gas sensing performance was studied at different operating temperature in the range of 25–150°C for the gas concentration of 500 ppm. Themaximum sensitivity (𝑆 = 79%) to H2S was found at lower temperature of 50 °C. The quick response (4 s) and fast recovery (8 s) are the main features of this film.

    • Author Affiliations


      Ramesh H Bari1 Parag P Patil1 Sharad B Patil1 Anil R Bari2

      1. Department of Physics, G. D. M. Arts, K. R. N. Commerce and M. D. Science College, Jamner 424 206, India
      2. Department of Physics, Arts, Commerce and Science College, Bodwad 425 310, India
    • Dates

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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