Pb(Zr0.53Ti0.47)O3 (PZT) thin films were prepared on Pt/Ti/SiO2/Si substrate by sol–gel method. The effect of film thickness on microstructure, ferroelectric and dielectric properties was investigated. The single-phase PZT films were obtained with different thicknesses. PZT films with a thickness of 190–440 nm had better dielectric and ferroelectric properties. The epoxy/PZT film/epoxy sandwiched composites were prepared. The thickness of PZT films influenced their damping properties of the composites, and the epoxy-based composites embedded with 310 nm-thick PZT films had the largest damping loss factor of 0.915.
Volume 45, 2022
Continuous Article Publishing mode
Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
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