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    • Keywords

       

      Pb(Zr0.53Ti0.47)O3 thin film; sol–gel method; film thickness; damping property; epoxy-based composite.

    • Abstract

       

      Pb(Zr0.53Ti0.47)O3 (PZT) thin films were prepared on Pt/Ti/SiO2/Si substrate by sol–gel method. The effect of film thickness on microstructure, ferroelectric and dielectric properties was investigated. The single-phase PZT films were obtained with different thicknesses. PZT films with a thickness of 190–440 nm had better dielectric and ferroelectric properties. The epoxy/PZT film/epoxy sandwiched composites were prepared. The thickness of PZT films influenced their damping properties of the composites, and the epoxy-based composites embedded with 310 nm-thick PZT films had the largest damping loss factor of 0.915.

    • Author Affiliations

       

      Guo Dongyun1 Mao Wei1 Qin Yan1 Huang Zhixiong1 Wang Chuanbin1 Shen Qiang1 Zhang Lianmeng1

      1. State Key Laboratory of Advanced Technology for Materials Synthesis and Processing and School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, China
    • Dates

       
  • Bulletin of Materials Science | News

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