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      https://www.ias.ac.in/article/fulltext/boms/034/03/0507-0513

    • Keywords

       

      Microstructure; defects; X-ray diffraction technique; positron annihilation spectroscopy.

    • Abstract

       

      Zr–1Nb samples were irradiated with 116 MeV O5+ ions at different doses ranging from 5 × 1017 to 8 × 1018 O5+/m2. X-ray diffraction line profile analysis was performed to characterize the microstructural parameters of these samples. Average domain size, microstrain and dislocation density were estimated as a function of dose. An anomaly was observed in the values of these parameters at a dose of 2 × 1018 O5+/m2. Positron annihilation spectroscopy was used to determine the existence and nature of vacancy clusters in the samples. Isochronal annealing was carried out for a sample to study the evolution of defect clusters.

    • Author Affiliations

       

      P S Chowdhury1 P Mukherjee1 N Gayathri1 M Bhattacharya1 A Chatterjee1 P Barat1 P M G Nambissan2

      1. Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata 700 064, India
      2. Saha Institute of Nuclear Physics, 1/AF Bidhan Nagar, Kolkata 700 064, India
    • Dates

       
  • Bulletin of Materials Science | News

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