• Structural characterization of lead sulfide thin films by means of X-ray line profile analysis

    • Fulltext


        Click here to view fulltext PDF

      Permanent link:

    • Keywords


      PbS thin films; X-ray diffraction; average internal stress; microstrain.

    • Abstract


      X-ray diffraction patterns of chemically deposited lead sulphide thin films have been recorded and X-ray line profile analysis studies have been carried out. The lattice parameter, crystallite size, average internal stress and microstrain in the film are calculated and correlated with molarities of the solutions. Both size and strain are found to contribute towards the broadening of X-ray diffraction line. The values of the crystallite size are found to be within the range from 22–33 nm and the values of strain to be within the range from 1.0 × 10-3–2.5 × 10-3.

    • Author Affiliations


      N Choudhury1 B K Sarma1

      1. Department of Physics, Gauhati University, Guwahati 781 014, India
    • Dates

  • Bulletin of Materials Science | News

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

© 2017-2019 Indian Academy of Sciences, Bengaluru.