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      https://www.ias.ac.in/article/fulltext/boms/030/01/0005-0007

    • Keywords

       

      AlSb; thin film; RBS; optical band gap.

    • Abstract

       

      In this paper, we present preparation and characterization of Al–Sb bilayer thin films. Thin films of thicknesses, 3000/1000 Å and 3000/1500 Å, were obtained by the thermal evaporation (resistive heating) method. Vacuum annealing and rapid thermal annealing methods were used to mix bilayer thin film structure. Results obtained from optical band gap data and Rutherford back scattering spectrometry showed mixing of Al–Sb bilayer system.

    • Author Affiliations

       

      R K Mangal1 B Tripathi2 M Singh2 Y K Vijay2

      1. Jaipur Engineering College and Research Centre, Jaipur 303 905, India
      2. Department of Physics, University of Rajasthan, Jaipur 302 004, India
    • Dates

       
  • Bulletin of Materials Science | News

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      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
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      Posted on July 25, 2019

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