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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/029/06/0605-0609

    • Keywords

       

      Polymethyl methacrylate (PMMA); ion irradiation; dielectric properties; microhardness; Mössbauer spectroscopy; AFM.

    • Abstract

       

      Thin films of polymethyl methacrylate (PMMA) were synthesized. Ferric oxalate was dispersed in PMMA films. These films were irradiated with 80 MeV O6+ ions at a fluence of 1 × 1011 ions/cm2. The radiation induced changes in electrical conductivity, Mössbauer parameter, microhardness and surface roughness were investigated. It is observed that hardness and electrical conductivity of the film increases with the concentration of dispersed ferric oxalate and also with the fluence. It indicates that ion beam irradiation promotes

      1. the metal to polymer bonding and

      2. convert the polymeric structure into hydrogen depleted carbon network.

      Thus irradiation makes the polymer harder and more conductive. Before irradiation, no Mössbauer absorption was observed. The irradiated sample showed Mössbauer absorption, which seems to indicate that there is significant interaction between the metal ion and polymer matrix. Atomic force microscopy shows that the average roughness (𝑅a) of the irradiated film is lower than the unirradiated one.

    • Author Affiliations

       

      N L Singh1 Anjum Qureshi1 A K Rakshit2 D K Avasthi3

      1. Physics Department, M.S. University of Baroda, Vadodara 390 002, India
      2. Chemistry Department, M.S. University of Baroda, Vadodara 390 002, India
      3. Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110 067, India
    • Dates

       

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