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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/029/02/0187-0191

    • Keywords

       

      Swift heavy ion; metal silicide; interface; GIXRD; 𝐼–𝑉 characteristics.

    • Abstract

       

      Synthesis of swift heavy ion induced metal silicide is a new advancement in materials science research. We have investigated the mixing at Co/Si interface by swift heavy ion beam induced irradiation in the electronic stopping power regime. Irradiations were undertaken at room temperature using 120 MeV Au ions at the Co/Si interface for investigation of ion beam mixing at various doses: 8 × 1012, 5 × 1013 and 1 × 1014 cm-2. Formation of different phases of cobalt silicide is identified by the grazing incidence X-ray diffraction (GIXRD) technique, which shows enhancement of intermixing and silicide formation as a result of irradiation. 𝐼–𝑉 characteristics at Co/Si interface were undertaken to understand the irradiation effect on conduction mechanism at the interface.

    • Author Affiliations

       

      Garima Agarwal1 Ankur Jain1 Shivani Agarwal1 D Kabiraj2 I P Jain1

      1. Materials Science Laboratory, Centre for Non-Conventional Energy Resources, University of Rajasthan, Jaipur 302 004, India
      2. Nuclear Science Centre, Aruna Asaf Ali Marg, New Delhi 110 067, India
    • Dates

       

© 2017 Indian Academy of Sciences, Bengaluru.