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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/025/06/0473-0475

    • Keywords

       

      Silicone rubber; surface degradation; tracking; WAXD; TG–DTA.

    • Abstract

       

      In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG–DTA) studies. The tracking time was different for a.c. and d.c. voltages.

    • Author Affiliations

       

      Uma Maheswar Rao1 S S M S Abdul Majeed2 C Venkataseshaiah1 R Sarathi1

      1. Department of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, India
      2. Department of Polymer Technology, Crescent Engineering College, Chennai 600 048, India
    • Dates

       
  • Bulletin of Materials Science | News

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