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    • Keywords


      Silicone rubber; surface degradation; tracking; WAXD; TG–DTA.

    • Abstract


      In the present work, tracking phenomena has been studied with silicone rubber material under the a.c. and d.c. voltages following IEC-587 standards. The surface condition of the tracked zone was analysed using wide angle X-ray diffraction (WAXD) and thermogravimetric differential thermal analysis (TG–DTA) studies. The tracking time was different for a.c. and d.c. voltages.

    • Author Affiliations


      Uma Maheswar Rao1 S S M S Abdul Majeed2 C Venkataseshaiah1 R Sarathi1

      1. Department of Electrical Engineering, Indian Institute of Technology, Chennai 600 036, India
      2. Department of Polymer Technology, Crescent Engineering College, Chennai 600 048, India
    • Dates

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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