A comprehensive analysis of size and strain broadened profile shapes in X-ray diffraction line broadening analysis is presented. Both size and strain broadened profiles were assumed to be Voigtian and the derived microstructural parameters (size and strain) were found to be in close agreement with those calculated from model independent Warren–Averbach method. The method is applied to three different alumina samples viz. micron size 𝛼-alumina (𝛼-Al2O3) prepared by the combustion of aluminium nitrate and urea mixture, annealed samples and commercial 𝛼-Al2O3 sample. It is likely from the present analysis that a significant Gaussian size contribution is related to narrow size distribution observed from the analysis. It has been concluded that present Voigtian analysis is more reliable and may largely replace the earlier simplified integral breadth methods of analysis often used in line broadening analysis.
Volume 43, 2020
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