𝐼–𝑧 spectroscopy measurements using a scanning tunnelling microscope (STM) were carried out to determine the change in the work function of a W tip following one monolayer (1 ML) deposition of Ni and subsequent annealing at 700 K. The variation in the actual gap voltage obtained from the 𝐼–𝑧 data of the clean tip was used in the calculation. The estimated values of the change in work function, 0.16 eV and 0.59 eV, for as-deposited and annealed tips, respectively match closely with the reported values. The method is generally applicable to chemically modified metal tips.
Volume 45, 2022
Continuous Article Publishing mode
Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
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