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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/023/04/0313-0317

    • Keywords

       

      ZnSe thin films; X-ray diffraction; average internal stress; microstrain; dislocation density

    • Abstract

       

      Thermally evaporated ZnSe thin films deposited on glass substrates within substrate temperatures (Ts)at 303 K-623 K are of polycrystalline nature having f.c.c. zincblende structure. The most preferential orientation is along [111] direction for all deposited films together with other abundant planes [220] and [311]. The lattice parameter, grain size, average internal stress, microstrain, dislocation density and degree of preferred orientation in the film are calculated and correlated withTs.

    • Author Affiliations

       

      Pradip Kr Kalita1 B K Sarma1 H L Das1

      1. Department of Physics, Gauhati University, Guwahati - 781 014, India
    • Dates

       
  • Bulletin of Materials Science | News

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