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    • Keywords


      Decagonal quasicrystals; ordering; electron microscopy; diffuse intensity

    • Abstract


      Detailed transmission electron microscopy study was carried out in single crystals of a decagonal phase in the Al-Cu-Co-Si quaternary system. X-ray diffraction and convergent beam electron diffraction patterns of the powder samples confirmed the structures to be decagonal quasicrystals. No microcrystalline nor crystalline phases could be identified. Thin slices normal to the 10-fold directions were prepared for transmission electron microscopy. Diffuse streaks along symmetric directions around the fundamental spots were observed in the diffraction patterns. Bright field images and dark field images showed discontinuous lines or striations lying perpendicular to the direction of diffuse streaking. The striation contrast appears to be originating from anti-phase boundary (APB) in the decagonal superstructures. The diffuse streaks seem to be a characteristic feature of a partially ordered decagonal superlattice structure. The atomic rearrangement or phasonic movement in certain symmetric directions along the pentagrids or Ammann lines in the structure has obviously caused the type of contrast observed in the images. The evolution of rhombic domains consisting of APBs in localized regions can be understood as one of the signature of an intermediate structural state formed prior to a superstructure formation.

    • Author Affiliations


      N K Mukhopadhyay1 G V S Sastry1 G C Weatherly1 2

      1. Department of Metallurgical Engineering, Banaras Hindu University, Varanasi - 221 005, India
      2. Institute for Materials Research, McMaster University - L8S 4M1, Canada
    • Dates

  • Bulletin of Materials Science | News

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