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      https://www.ias.ac.in/article/fulltext/boms/021/04/0303-0308

    • Keywords

       

      Phase instabilities; nitrogen implantation; X-ray diffraction

    • Abstract

       

      Grazing incidence X-ray diffraction, performed on a 70 keV nitrogen implanted Ti-6Al-4V system, reveals phase instabilities, during the course of nitride formation. With the build up of unbound N atom concentration, for a dose of 1×1016 ions/cm2, the surface region becomesα-rich, whereas, on precipitation of Ti-nitrides at a high dose of 1×1017 ions/cm2, theβ-Ti phase reappears, at the surface and beyond the implanted zone. The low concentration of V and the strain in the nitrided zone, have led to radiation induced martensitic transformation of theβ-Ti phase.

    • Author Affiliations

       

      N Rajan1 T S Sampath Kumar1 K G M Nair1 2 K Krishan1 3

      1. Department of Nuclear Physics, University of Madras, Guindy Campus, Madras - 600 025, India
      2. Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603 102, India
      3. National Research and Technology Consortium, Parwanoo - 173 220, India
    • Dates

       
  • Bulletin of Materials Science | News

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