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    • Keywords


      Phase instabilities; nitrogen implantation; X-ray diffraction

    • Abstract


      Grazing incidence X-ray diffraction, performed on a 70 keV nitrogen implanted Ti-6Al-4V system, reveals phase instabilities, during the course of nitride formation. With the build up of unbound N atom concentration, for a dose of 1×1016 ions/cm2, the surface region becomesα-rich, whereas, on precipitation of Ti-nitrides at a high dose of 1×1017 ions/cm2, theβ-Ti phase reappears, at the surface and beyond the implanted zone. The low concentration of V and the strain in the nitrided zone, have led to radiation induced martensitic transformation of theβ-Ti phase.

    • Author Affiliations


      N Rajan1 T S Sampath Kumar1 K G M Nair1 2 K Krishan1 3

      1. Department of Nuclear Physics, University of Madras, Guindy Campus, Madras - 600 025, India
      2. Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603 102, India
      3. National Research and Technology Consortium, Parwanoo - 173 220, India
    • Dates

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

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      Posted on July 25, 2019

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