• An atomic force microscope study of carbon onions and related nanoparticles

    • Fulltext


        Click here to view fulltext PDF

      Permanent link:

    • Keywords


      Atomic force microscopy; carbon onions; fullerenes; carbon nanotubes

    • Abstract


      Carbon onions are found along with carbon nanotubes and other carbon nanoparticles in the cathodic deposit in the arc-vaporization of graphite. Atomic force microscopy has been used to characterize these particles on the basis of their sizes and shapes. Onion-like particles have three-dimensional, near spherical structure and are distinct from two-dimensional graphitic particles. The spherical shape and height to diameter ratios obtained using atomic force microscope, afford a distinction between onion-like structures and other carbon nanoparticles.

    • Author Affiliations


      Gargi Raina1 Rahul Sen1

      1. Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore - 560 064, India
    • Dates

  • Bulletin of Materials Science | News

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

© 2017-2019 Indian Academy of Sciences, Bengaluru.