• An atomic force microscope study of carbon onions and related nanoparticles

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      https://www.ias.ac.in/article/fulltext/boms/020/01/0001-0007

    • Keywords

       

      Atomic force microscopy; carbon onions; fullerenes; carbon nanotubes

    • Abstract

       

      Carbon onions are found along with carbon nanotubes and other carbon nanoparticles in the cathodic deposit in the arc-vaporization of graphite. Atomic force microscopy has been used to characterize these particles on the basis of their sizes and shapes. Onion-like particles have three-dimensional, near spherical structure and are distinct from two-dimensional graphitic particles. The spherical shape and height to diameter ratios obtained using atomic force microscope, afford a distinction between onion-like structures and other carbon nanoparticles.

    • Author Affiliations

       

      Gargi Raina1 Rahul Sen1

      1. Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bangalore - 560 064, India
    • Dates

       
  • Bulletin of Materials Science | News

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      Posted on July 25, 2019

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