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      https://www.ias.ac.in/article/fulltext/boms/018/01/0081-0091

    • Keywords

       

      Thin film; Cd1−xZnxTe; X-ray diffraction; electron microscopy

    • Abstract

       

      Thin films of synthesized Cd0·8Zn0·2Te have been deposited on glass substrate at different substrate temperatures. Different microstructural parameters like crystallite size, rms strain, dislocation density, stacking fault probability and stacking fault energy are determined by XRD, SEM, TEM and TED. XRD and XPS have been used to determine the composition. Variations of the microstructural parameters with film thickness and substrate temperature have been studied in order to obtain optimum growth condition for maximum particle size and least microstructural defects. An effort has been made to correlate the experimental results.

    • Author Affiliations

       

      B Samanta1 U Pal1 2 B K Samantaray1 T B Ghosh1 S L Sharma1 A K Chaudhuri1

      1. Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur - 721 302, India
      2. Departmento Fisica de Materiales, Facultad de Ciencias Fisicas, Universidad Complutense, Madrid - 28040, Spain
    • Dates

       
  • Bulletin of Materials Science | News

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