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    • Fulltext

       

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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/018/01/0081-0091

    • Keywords

       

      Thin film; Cd1−xZnxTe; X-ray diffraction; electron microscopy

    • Abstract

       

      Thin films of synthesized Cd0·8Zn0·2Te have been deposited on glass substrate at different substrate temperatures. Different microstructural parameters like crystallite size, rms strain, dislocation density, stacking fault probability and stacking fault energy are determined by XRD, SEM, TEM and TED. XRD and XPS have been used to determine the composition. Variations of the microstructural parameters with film thickness and substrate temperature have been studied in order to obtain optimum growth condition for maximum particle size and least microstructural defects. An effort has been made to correlate the experimental results.

    • Author Affiliations

       

      B Samanta1 U Pal1 2 B K Samantaray1 T B Ghosh1 S L Sharma1 A K Chaudhuri1

      1. Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur - 721 302, India
      2. Departmento Fisica de Materiales, Facultad de Ciencias Fisicas, Universidad Complutense, Madrid - 28040, Spain

    • Dates

       
      Published
      February 1995

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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