• Grain-boundary scattering in semiconductor films

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      https://www.ias.ac.in/article/fulltext/boms/017/07/1251-1258

    • Keywords

       

      Grain-boundary scattering; semiconductor; polycrystalline film; Franz-Keldysh effect

    • Abstract

       

      Alternative technique for studying grain-boundary scattering phenomena in high-resistivity semiconducting films has been indicated. The combined effect of the presence of electric field and mechanical stress at the grain boundaries was considered. It is shown that the grain boundary potential, density of trap states, and carrier concentration of the films can be obtained by measuring reflectances of the films deposited on non-absorbing substrates.

    • Author Affiliations

       

      A K Pal1

      1. Department of Materials Science, Indian Association for the Cultivation of Science, Calcutta - 700 032, India
    • Dates

       
  • Bulletin of Materials Science | News

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      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
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      Posted on July 25, 2019

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