• Grain-boundary scattering in semiconductor films

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    • Keywords


      Grain-boundary scattering; semiconductor; polycrystalline film; Franz-Keldysh effect

    • Abstract


      Alternative technique for studying grain-boundary scattering phenomena in high-resistivity semiconducting films has been indicated. The combined effect of the presence of electric field and mechanical stress at the grain boundaries was considered. It is shown that the grain boundary potential, density of trap states, and carrier concentration of the films can be obtained by measuring reflectances of the films deposited on non-absorbing substrates.

    • Author Affiliations


      A K Pal1

      1. Department of Materials Science, Indian Association for the Cultivation of Science, Calcutta - 700 032, India
    • Dates

  • Bulletin of Materials Science | News

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      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

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