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      https://www.ias.ac.in/article/fulltext/boms/017/05/0523-0531

    • Keywords

       

      Porous silicon; crystallite size dependence

    • Abstract

       

      Porous silicon prepared with anodic currents of 5 to 30 mA/cm2 are characterized for structural and electronic properties of surface using photoluminescence, grazing angle X-ray diffraction, photoconductivity, thermally stimulated exo electron emission and work function measurements. The observed results indicate that with increasing porosity the crystallite size decreases and the amount of silicon hydride and oxide-type species increases, exhibiting a tendency similar to that of hydrogenated amorphous silicon and hydrogenated microcrystalline silicon. Free-standing powder of porous silicon, characterized by bright photoluminescence at 730 nm, showed crystallites of nanometre dimensions under the transmission electron microscope.

    • Author Affiliations

       

      S V Bhoraskar1 Tejashree Bhave1 T A Railkar1

      1. Department of Physics, University of Poona, Pune - 411 007, India
    • Dates

       
  • Bulletin of Materials Science | News

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