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      https://www.ias.ac.in/article/fulltext/boms/017/03/0235-0243

    • Keywords

       

      Optical constants; ellipsometry; spray pyrolysis; CdS thin films

    • Abstract

       

      CdS thin films were prepared by spray pyrolysis techniques. Variable angle spectroscopic ellipsometry was used for optical constant calculations. Multiple angle measurements were taken in the most sensitive angle of incidence region. The sensitive regions of angle of incidence were obtained theoretically using 3-dimensional graph ofδψ andδΔ. Real partn and imaginary partk of the complex refractive index of the samples were calculated in the wavelength range 470–650 nm, taking into account surface roughness. Bruggeman’s effective medium approximation is used for analysis of the surface rough layer of the thin films.

    • Author Affiliations

       

      Sunny Mathew1 K P Vijayakumar1

      1. Department of Physics, Cochin University of Science and Technology, Cochin - 682 022, India
    • Dates

       
  • Bulletin of Materials Science | News

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