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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/015/02/0183-0188

    • Keywords

       

      Photothermal deflection technique; damage threshold; polymer; Nd-YAG laser; He-Ne laser

    • Abstract

       

      Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.

    • Author Affiliations

       

      K Rajasree1 A V Ravikumar1 P Radhakrishnan1 V P N Nampoori1 C P G Vallabhan1

      1. Department of Physics, Cochin University of Science and Technology, Cochin - 682 022, India
    • Dates

       

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