• Variations of interlayer structure in CuxS/CdS bilayer thin film with annealing of CdS: an ellipsometric study

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    • Keywords

       

      CuxS/CdS; interlayer ellipsometry; effective medium theory; chemiplating

    • Abstract

       

      Irregularities at the interface in CuxS/CdS thin films can be controlled by annealing CdS film prior to chemiplating. The interlayer formed on CdS films annealed at 200°C is comparatively smooth. In CdS films annealed at higher temperatures, the interlayer is rather thick and the CdS intrusions into this layer are thin. An ellipsometric technique is used for this study and the effective medium theory which is utilized to interpret the results is based on the difference in reaction rate in the grains as well as grain boundaries during chemiplating.

    • Author Affiliations

       

      K P Vijayakumar1

      1. Department of Physics, Cochin University of Science and Technology, Cochin - 682 022, India
    • Dates

       
  • Bulletin of Materials Science | News

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