Electrical resistivity of holmium hydride films
The electrical resistivity and temperature coefficient of resistance of polycrystalline holmium hydride films, grown on glass slides, have been measured in vacuo. Experimental results show that the resistivity decreases with decreasing film thickness. The resistivity of 200 Å holmium dihydride film is less than that of the parent metal. The observed behaviour of the thickness dependence of the resistivity has been explained in terms of the structural phase change.
Volume 43, 2020
Continuous Article Publishing mode
Click here for Editorial Note on CAP Mode