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      Permanent link:
      https://www.ias.ac.in/article/fulltext/boms/008/01/0061-0069

    • Keywords

       

      Microstructure; line profile analysis; cold-worked state; silver base ternary alloys; stacking fault probabilities

    • Abstract

       

      X-ray diffraction line profiles of five silver base ternary alloys in α-phase with varying atomic percentages of cadmium and indium were recorded in both cold-worked and annealed states of the samples. Detailed studies on the profiles involving peak shift, peak asymmetry and Fourier analysis of line shapes have been carried out to evaluate microstructural parameters such as deformation fault probabilities,rms strains and dislocation densities. It was found that the addition of indium has a marked effect in producing deformation fault probabilities in comparison to that of adding cadmium in ternary silver base alloys. Compound fault probability was found to be maximum for the alloy Ag-10Cd-15In.

    • Author Affiliations

       

      S Venkat Reddy1 2 S V Suryanarayana1

      1. Department of Physics, University College of Science, Osmania University, Hyderabad - 500 007, India
      2. Sardar Patel College, Secunderabad - 500 025, India

    • Dates

       
      Published
      February 1986
      Manuscript received
      7 November 1983
      Manuscript revised
      7 November 1985

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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