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Microstructure; line profile analysis; cold-worked state; silver base ternary alloys; stacking fault probabilities

X-ray diffraction line profiles of five silver base ternary alloys in α-phase with varying atomic percentages of cadmium and indium were recorded in both cold-worked and annealed states of the samples. Detailed studies on the profiles involving peak shift, peak asymmetry and Fourier analysis of line shapes have been carried out to evaluate microstructural parameters such as deformation fault probabilities,rms strains and dislocation densities. It was found that the addition of indium has a marked effect in producing deformation fault probabilities in comparison to that of adding cadmium in ternary silver base alloys. Compound fault probability was found to be maximum for the alloy Ag-10Cd-15In.

S Venkat Reddy^{1 2} S V Suryanarayana¹

1. Department of Physics, University College of Science, Osmania University, Hyderabad - 500 007, India
2. Sardar Patel College, Secunderabad - 500 025, India

Published

February 1986

Manuscript received

7 November 1983

Manuscript revised

7 November 1985