The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relpHK·L of a faulted hexagonal crystal, mounted about itsc-axis on the goniometer head attached to the ø-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented.
Volume 44, 2021
Continuous Article Publishing mode
Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
Chemical Sciences 2020
Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
Physical Sciences 2020
Click here for Editorial Note on CAP Mode