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    • Keywords


      Incident beam divergence; diffuse streaks; Ewald sphere; crystal orientation

    • Abstract


      The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relpHK·L of a faulted hexagonal crystal, mounted about itsc-axis on the goniometer head attached to the ø-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented.

    • Author Affiliations


      Dhananjai Pandey1 S Lele2 Lalita Prasad2 J P Gauthier3

      1. School of Materials Science and Technology, Banaras Hindu University, Varanasi - 221 005, India
      2. Department of Metallurgical Engineering, Banaras Hindu University, Varanasi - 221 005, India
      3. Laboratoire de Mineralogie-Cristallographie, Universite’ Claude Bernard Lyon I, Villeurbanne Cedex - 69622, France
    • Dates

  • Bulletin of Materials Science | News

    • Dr Shanti Swarup Bhatnagar for Science and Technology

      Posted on October 12, 2020

      Prof. Subi Jacob George — Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur, Bengaluru
      Chemical Sciences 2020

      Prof. Surajit Dhara — School of Physics, University of Hyderabad, Hyderabad
      Physical Sciences 2020

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

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