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      https://www.ias.ac.in/article/fulltext/boms/007/05/0499-0507

    • Keywords

       

      Incident beam divergence; diffuse streaks; Ewald sphere; crystal orientation

    • Abstract

       

      The influence of incident beam divergence on the length of the streak intercepted by the Ewald sphere is considered, as a relpHK·L of a faulted hexagonal crystal, mounted about itsc-axis on the goniometer head attached to the ø-circle, is brought into diffracting condition for the bisecting setting of a 4-circle diffractometer. For the special crystal mounting correction factors required to convert the measured intensities corresponding to a fixed length of the streak are derived. A procedure for experimentally verifying the mathematical approach employed in these derivations is also presented.

    • Author Affiliations

       

      Dhananjai Pandey1 S Lele2 Lalita Prasad2 J P Gauthier3

      1. School of Materials Science and Technology, Banaras Hindu University, Varanasi - 221 005, India
      2. Department of Metallurgical Engineering, Banaras Hindu University, Varanasi - 221 005, India
      3. Laboratoire de Mineralogie-Cristallographie, Universite’ Claude Bernard Lyon I, Villeurbanne Cedex - 69622, France
    • Dates

       
  • Bulletin of Materials Science | News

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