• High resolution electron microscopy as a tool for structural investigations

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    • Keywords


      High resolution electron microscopy; silicon carbide; lattice imaging; structural investigation; C-periodicity; stacking sequence; polytype in SiC

    • Abstract


      Lattice imaging technique has been used to study an unknown high period polytype structure of SiC. A known structure like 6H has been studied by tilted beam two-dimensional images to determine optimum conditions for deriving structural information. The technique has then been used to determine a new structure (411R and its intergrowth structures), and the lattice imaging technique as a tool for structural investigation has been critically evaluated.

    • Author Affiliations


      G Singh1 R S Rai1

      1. Department of Physics, Banaras Hindu University, Varanasi - 221 005, India
    • Dates

  • Bulletin of Materials Science | News

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      Posted on July 25, 2019

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