X-ray topographic analysis of dislocation line defectsin calcium fluoride crystals
One-to-one correspondence of dislocation etch pits have been established on the matched cleavage faces and on the opposite sides of thin flakes of calcium fluoride crystals. By selecting 022 and 022 reflections and MoKα1 radiation, stereopair projection x-rays topographs were studied and critically compared with optical micrographs. The dislocation etch pits and dislocation out crop images show a close resemblance. The orientation of the Burgers vectors of the dislocation lines has been identified and these lines lie parallel to the <110> directions. The growth history of the stratigraphical pattern has been studied using x-ray topographic technique.
Volume 42 | Issue 6
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