• Determination of the composition of binary systems by the ratio method employing SEM-EDAX

    • Fulltext


        Click here to view fulltext PDF

      Permanent link:

    • Keywords


      X-ray emission; scanning electron microscopy; binary systems

    • Abstract


      By employing x-ray emission in a scanning electron microscope (SEM), it has been shown that compositions of binary systems such as As-Se glasses, Al-Zn alloys and copper sulphides can be determined.

    • Author Affiliations


      G N Subbanna1

      1. Materials Research Laboratory, Indian Institute of Science, Bangalore - 560 012, India
    • Dates

  • Bulletin of Materials Science | News

    • Editorial Note on Continuous Article Publication

      Posted on July 25, 2019

      Click here for Editorial Note on CAP Mode

© 2017-2019 Indian Academy of Sciences, Bengaluru.