• Determination of the composition of binary systems by the ratio method employing SEM-EDAX

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      https://www.ias.ac.in/article/fulltext/boms/003/04/0443-0445

    • Keywords

       

      X-ray emission; scanning electron microscopy; binary systems

    • Abstract

       

      By employing x-ray emission in a scanning electron microscope (SEM), it has been shown that compositions of binary systems such as As-Se glasses, Al-Zn alloys and copper sulphides can be determined.

    • Author Affiliations

       

      G N Subbanna1

      1. Materials Research Laboratory, Indian Institute of Science, Bangalore - 560 012, India
    • Dates

       
  • Bulletin of Materials Science | News

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